Build you own ESP8. Web Serverwifi. setmodewifi. STATIONwifi. sta. Core. com,1. 23. Dynamic IP Addressled. OUTPUTgpio. modeled. OUTPUTsrvnet. create. Servernet. TCPsrv listen8. A Z. HTTP        ifmethodnilthen            ,method,pathstring. A Z. HTTP        end        local GET        ifvarsnilthen            fork,vinstring. GETkv            end        end        bufbuf. AutomationTalk. info is automation blog which covers tutorial on PLC programming, HMI and SCADA. Information about free Softwares, manual etc. Basic Commands for ABP Join Can two RN2483 or RN2903 modems communicate pointtopoint P2P without a gateway LoRaWAN looks great, but I dont want to pay a. ESP8. 26. 6 Web Serverlt h. GPIO0 lt a href ON1 lt button ONlt button lt a nbsp lt a href OFF1 lt button OFFlt button lt a lt p         bufbuf. GPIO2 lt a href ON2 lt button ONlt button lt a nbsp lt a href OFF2 lt button OFFlt button lt a lt p         local on,off,        ifGET. ON1then              gpio. HIGH        elseifGET. OFF1then              gpio. LOW        elseifGET. ON2then              gpio. Labview Serial Port Tutorial C++' title='Labview Serial Port Tutorial C++' />HIGH        elseifGET. OFF2then              gpio. LOW        end        client sendbuf        client close        collectgarbage    endend. CXIV/ATTACH-AEEE-8PCT6L/$FILE/bitsSnip.png' alt='Labview Serial Port Tutorial' title='Labview Serial Port Tutorial' />Automatic test equipment Wikipedia. Automatic test equipment or automated test equipment ATE is any apparatus that performs tests on a device, known as the device under test DUT, equipment under test EUT or unit under test UUT, using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments real or simulated electronic test equipment capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits. Where ATE is usededitATE is widely used in the electronic manufacturing industry to test electronic components and systems after being fabricated. ATE is also used to test avionics and the electronic modules in automobiles. It is used in military applications like radar and wireless communication. ATE in the semiconductor industryeditSemiconductor ATE, named for testing semiconductor devices, can test a wide range of electronic devices and systems, from simple components resistors, capacitors, and inductors to integrated circuits ICs, printed circuit boards PCBs, and complex, completely assembled electronic systems. ATE systems are designed to reduce the amount of test time needed to verify that a particular device works or to quickly find its faults before the part has a chance to be used in a final consumer product. To reduce manufacturing costs and improve yield, semiconductor devices should be tested after being fabricated to prevent defective devices ending up with the consumer. Components of ATEeditThe Semiconductor ATE architecture consists of master controller usually a computer that synchronizes one or more source and capture instruments listed below. Historically, custom designed controllers or relays were used by ATE systems. The Device Under Test DUT is physically connected to the ATE by another robotic machine called a Handler or Prober and through a customized Interface Test Adapter ITA or fixture that adapts the ATEs resources to the DUT. Industrial PCeditThe Industrial PC is nothing but a normal desktop computer packaged in 1. PCI PCIe slots for accommodating the Signal stimulatorsensing cards. This takes up the role of a controller in the ATE. Development of test applications and result storage is managed in this PC. Most modern semiconductor ATEs include multiple computer controlled instruments to source or measure a wide range of parameters. The instruments may include Device Power Supplies DPS,12 Parametric Measurement Units PMU, Arbitrary Waveform Generators AWG, Digitizers, Digital IOs, and utility supplies. The instruments perform different measurements on the DUT, and the instruments are synchronized so that they source and measure waveforms at the proper times. Based on the requirement of response time, real time systems are also considered for stimulation and signal capturing. Reading writing Arduino UNO values via USB serial port in LabView 2009 makes a nice DAQ Alternative Duration 352. Walter Martinez 12,845 views. Mass interconnecteditThe Mass interconnect is a connector interface between test instruments PXI, VXI, LXI, GPIB, SCXI, PCI and devicesunits under test DUUT. This section acts as a nodal point for signals going inout between ATE and DUUT. Example Simple voltage measurementeditFor example, to measure a voltage of a particular semiconductor device, the Digital Signal Processing DSP instruments in the ATE measure the voltage directly and send the results to a computer for signal processing, where the desired value is computed. N1-q4Gbx9Co/V69bS1YISRI/AAAAAAAAAaM/1VhQeFHJQ-QsSEhRZINlbqmk4a8sDgLcACLcB/s1600/Block%2BDiagram%2BComplex.PNG' alt='Labview Serial Port Tutorial' title='Labview Serial Port Tutorial' />This example shows that conventional instruments, like an Ammeter, may not be used in many ATEs due to the limited number of measurements the instrument could make, and the time it would take to use the instruments to make the measurement. Structural Steel Designing Software. One key advantage to using DSP to measure the parameters is time. If we have to calculate the peak voltage of an electrical signal and other parameters of the signal, then we have to employ a peak detector instrument as well as other instruments to test the other parameters. If DSP based instruments are used, however, then a sample of the signal is made and the other parameters can be computed from the single measurement. Test parameter requirements vs test timeeditNot all devices are tested equally. Testing adds costs, so low cost components are rarely tested completely, whereas medical or high costs components where reliability is important are frequently tested. AllAboutEE/media/images/post-photos/PIC18-LabVIEW-Write-Block-Diagram.jpg' alt='Labview Serial Port Tutorial' title='Labview Serial Port Tutorial' />But testing the device for all parameters may or may not be required depending on the device functionality and end user. For example, if the device finds application in medical or life saving products then many of its parameters must be tested, and some of the parameters must be guaranteed. But deciding on the parameters to be tested is a complex decision based on cost vs yield. If the device is a complex digital device, with thousands of gates, then test fault coverage has to be calculated. Here again, the decision is complex based on test economics, based on frequency, number and type of IOs in the device and the end use application. Handler or prober and device test adaptereditATE can be used on packaged parts typical IC chip or directly on the Silicon Wafer. Packaged parts use a handler to place the device on a customized interface board, whereas silicon wafers are tested directly with high precision probes. The ATE systems interact with the handler or prober to test the DUT. Packaged part ATE with handlerseditATE systems typically interface with an automated placement tool, called a handler, that physically places the Device Under Test DUT on an Interface Test Adapter ITA so that it can be measured by the equipment. There may also be an Interface Test Adapter ITA, a device just making electronic connections between the ATE and the Device Under Test also called Unit Under Test or UUT, but also it might contain an additional circuitry to adapt signals between the ATE and the DUT and has physical facilities to mount the DUT. Finally, a socket is used to bridge the connection between the ITA and the DUT. A socket must survive the rigorous demands of a production floor, so they are usually replaced frequently. Simple electrical interface diagram ATE ITA DUT package lt Handler. Silicon wafer ATE with proberseditWafer based ATEs typically use a device called a Prober that moves across a silicon wafer to test the device. Simple electrical interface diagram ATE Prober Wafer DUTMulti siteeditOne way to improve test time is to test multiple devices at once. ATE systems can now support having multiple sites where the ATE resources are shared by each site. Some resources can be used in parallel, others must be serialized to each DUT. Programming ATEeditThe ATE computer uses modern computer languages like C, C, Java, Python, Lab. VIEW or Smalltalk with additional statements to control the ATE equipment through standard and proprietary application programming interfaces API. Also some dedicated computer languages exists, like Abbreviated Test Language for All Systems ATLAS. Automatic test equipment can also be automated using a test execution engine such as National Instruments Test. Stand. 3Sometimes automatic test pattern generation is used to help design the series of tests.